Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 (Frontiers in Electronic Testing)

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 (Frontiers in Electronic Testing)

by Mohammad Tehranipoor (Editor)

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Format: Paperback
Pages: 420
Edition: Softcover reprint of hardcover 1st ed. 2008
Publisher: Springer
Published: 23 Nov 2010

ISBN 10: 144194513X
ISBN 13: 9781441945136