Fundamentals of Nanoscale Film Analysis

Fundamentals of Nanoscale Film Analysis

by James W. Mayer (Contributor), L.C. Feldman (Contributor), Terry L. L. Alford (Author)

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Format: Paperback
Pages: 352
Edition: Softcover reprint of hardcover 1st ed. 2007
Publisher: Springer
Published: 29 Oct 2010

ISBN 10: 1441939806
ISBN 13: 9781441939807