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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by Adam Foster (Author), Adam Foster (Author), Werner A. Hofer (Contributor)

$146.03

Quantity

10 in stock

More Information

Format: Paperback
 Pages: 296
 Edition: Softcover reprint of hardcover 1st ed. 2006
 Publisher: Springer
Published: 23 Nov 2010
ISBN 10: 1441923063
ISBN 13: 9781441923066