Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by PatrickGirard (Author), Alberto Bosio (Author), Luigi Dilillo (Author), SergePravossoudovitch (Author), Arnaud Virazel (Author)

• New

  Hardcover
  2009

  $146.29

  Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.