Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by PatrickGirard (Author), Alberto Bosio (Author), Arnaud Virazel (Author), SergePravossoudovitch (Author), Luigi Dilillo (Author)

Synopsis

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.

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More Information

Format: Hardcover
Pages: 171
Publisher: Springer
Published: 11 Nov 2009

ISBN 10: 1441909370
ISBN 13: 9781441909374