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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

by KrishnenduChakrabarty (Editor), SandeepK.Goel (Editor)

$204.77

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1 in stock

More Information

Format: Hardcover
 Pages: 259
 Edition: 1
 Publisher: CRC Press
Published: 13 Nov 2013
ISBN 10: 1439829411
ISBN 13: 9781439829417