Defects in Microelectronic Materials and Devices

by Daniel M . Fleetwood (Editor), RonaldD.Schrimpf (Editor)

New
Hardcover
2008
$189.81

Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. This book discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices.

Synopsis

Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. This book discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices.

$189.81

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1 in stock

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Format: Hardcover
Pages: 770
Edition: 1
Publisher: CRC Press
Published: 19 Nov 2008
ISBN 10: 1420043765
ISBN 13: 9781420043761

Defects in Microelectronic Materials and Devices

New

$189.81

Synopsis

$189.81

More Information