CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

by Andrei Pavlov (Author), Manoj Sachdev (Author)

New
Hardcover
2008
$184.35

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

Synopsis

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

$184.35

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 212
Edition: illustrated edition
Publisher: Springer
Published: 21 Jun 2008
ISBN 10: 1402083629
ISBN 13: 9781402083624

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

New

$184.35

Synopsis

$184.35

More Information