by Ahmed Helmy (Author), Mohammed Ismail (Author), Ahmed Helmy (Author), Mohammed Ismail (Author)
The book reports modeling and simulation techniques for substrate noise coupling effects in RFICs and introduces isolation structures and design guides to mitigate such effects with the ultimate goal of enhancing the yield of RF and mixed signal SoCs. The book further reports silicon measurements, and new test and noise isolation structures.
Format: Hardcover
Pages: 136
Edition: 2008
Publisher: Springer
Published: 08 Apr 2008
ISBN 10: 1402081650
ISBN 13: 9781402081651