Power-constrained Testing of Vlsi Circuits (Frontiers in Electronic Testing): A Guide to the IEEE 1149.4 Test Standard: 22B

by Bashir M. Al-Hashimi (Author), Nicola Nicolici (Author)

New
Illustrated
2003
$164.75

$164.75

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Format: Illustrated
Pages: 192
Edition: 2003
Publisher: Springer
Published: 28 Feb 2003
ISBN 10: 140207235X
ISBN 13: 9781402072352

Power-constrained Testing of Vlsi Circuits (Frontiers in Electronic Testing): A Guide to the IEEE 1149.4 Test Standard: 22B

New

$164.75

$164.75

More Information