Thermal Testing of Integrated Circuits

by Moshe Kress (Author), JosepAltet (Author)

New
Hardcover
2002
$134.49

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

Synopsis

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

$134.49

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 220
Edition: 2002
Publisher: Springer
Published: 30 Jun 2002
ISBN 10: 1402070764
ISBN 13: 9781402070761

Thermal Testing of Integrated Circuits

New

$134.49

Synopsis

$134.49

More Information