by WeiLi (Author), Cher Ming Tan (Author), ZhenghaoGan (Author), YuejinHou (Author)
This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
Format: Hardcover
Pages: 157
Edition: 1st Edition.
Publisher: Springer
Published: 07 Mar 2011
ISBN 10: 0857293095
ISBN 13: 9780857293091