Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

by Michael Pecht (Author), Michael Pecht (Author), Pradeep Lall (Author), Edward B. Hakim (Author)

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Hardcover
1997
$122.51

$122.51

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Format: Hardcover
Pages: 336
Edition: 1
Publisher: CRC Press
Published: 24 Apr 1997
ISBN 10: 0849394503
ISBN 13: 9780849394508

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

New

$122.51

$122.51

More Information