by Arthur T . Hubbard (Editor), JohnC.Riviere (Editor), SverreMyhra (Editor)
Describes the physical basis and technical implementation of the commonly used techniques for materials characterization. This book features chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials.
Format: Hardcover
Pages: 671
Edition: 2
Publisher: CRC Press
Published: 24 Jun 2009
ISBN 10: 0849375584
ISBN 13: 9780849375583