by Joseph Glaz (Editor), Sylvan Wallenstein (Editor), Vladimir Pozdnyakov (Editor)
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
Format: Hardcover
Pages: 424
Edition: 2009
Publisher: Birkhäuser
Published: 28 May 2009
ISBN 10: 0817647481
ISBN 13: 9780817647483
From the reviews:
The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified. (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)
FREE UK DELIVERY 
Global shipping from £2.99
FREE UK DELIVERY
30 Day Refund Guarantee
