Hot-Carrier Reliability of Mos VLSI Circuits: 227 (The Springer International Series in Engineering and Computer Science)

by Yusuf Leblebici (Author), (Steve) Kang Sung-Mo (Steve) Kang (Author), Sung-Mo Kang (Author)

• New

  Illustrated
  1993

  $288.11

  The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.