Unified Methods for VLSI Simulation and Test Generation: 73 (The Springer International Series in Engineering and Computer Science)

Unified Methods for VLSI Simulation and Test Generation: 73 (The Springer International Series in Engineering and Computer Science)

by Kwang-Ting (Tim) Cheng (Author), Vishwani D. Agrawal (Author)

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Format: Hardcover
Pages: 164
Edition: 1989
Publisher: Springer
Published: 30 Jun 1989

ISBN 10: 0792390253
ISBN 13: 9780792390251