Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)

by Kwang-Ting(Tim)Cheng (Author), Angela Krstic (Author)

New
Hardcover
1998
$204.00

In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Synopsis

In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

$204.00

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 208
Publisher: Springer
Published: 31 Oct 1998
ISBN 10: 0792382951
ISBN 13: 9780792382959

Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)

New

$204.00

Synopsis

$204.00

More Information