Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

by NigelD.Browning (Editor), StephenJ.Pennycook (Editor)

Synopsis

A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

$178.24

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 406
Publisher: Cambridge University Press
Published: 06 Jul 2000

ISBN 10: 052155490X
ISBN 13: 9780521554909