Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

by NigelD.Browning (Editor), StephenJ.Pennycook (Editor)

Synopsis

A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

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10 in stock

More Information

Format: Paperback
Pages: 408
Edition: New Ed
Publisher: Cambridge University Press
Published: 23 Nov 2006

ISBN 10: 0521031702
ISBN 13: 9780521031707