Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

by TienT.Tsong (Author)

Synopsis

The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.

$51.99

Quantity

10 in stock

More Information

Format: Paperback
Pages: 400
Publisher: Cambridge University Press
Published: 15 Sep 2005

ISBN 10: 0521019931
ISBN 13: 9780521019934