Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12

by Giuseppe La Rosa (Author), Alvin W. Strong (Author), Ernest Y. Wu (Author), Jordi Sune (Author), Rolf-Peter Vollertsen (Author), Stewart E. Rauch III (Author), Timothy D. Sullivan (Author)

• New

  Hardcover
  2009

  $196.97

  This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.