Ellipsometry: A User's Guide

Ellipsometry: A User's Guide

by TOMPKINS (Author), Mc Gahan (Author)

Synopsis

While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.

$185.46

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 248
Edition: 1
Publisher: John Wiley & Sons
Published: 04 Mar 1999

ISBN 10: 0471181722
ISBN 13: 9780471181729