Statistical Analysis of Profile Monitoring (Wiley Series in Probability and Statistics)

by RassoulNoorossana (Author), Abbas Saghaei (Author), Amirhossein Amiri (Author)

• New

  Hardcover
  2011

  $136.75

  * This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials.