Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)

by EugeneR.Hnatek (Author)

• New

  Hardcover
  1993

  $193.65

  Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a