by EugeneR.Hnatek (Author)
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
Format: Hardcover
Pages: 196
Publisher: Springer
Published: 31 Aug 1993
ISBN 10: 0442006438
ISBN 13: 9780442006433