Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev (Author), JoséPinedadeGyvez (Author)

Synopsis

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

$283.85

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 349
Edition: 2nd ed.
Publisher: Springer
Published: 04 Jun 2007

ISBN 10: 0387465464
ISBN 13: 9780387465463