by Manoj Sachdev (Author), JoséPinedadeGyvez (Author)
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Format: Hardcover
Pages: 349
Edition: 2nd ed.
Publisher: Springer
Published: 04 Jun 2007
ISBN 10: 0387465464
ISBN 13: 9780387465463