Scanning Microscopy for Nanotechnology: Techniques and Applications

by ZhongLinWang (Editor), WeilieZhou (Editor)

• New

  Hardcover
  2006

  $258.33

  This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.