Matching Properties of Deep Sub-Micron MOS Transistors (The Springer International Series in Engineering and Computer Science)

by WillySansen (Author), JeroenA.Croon (Author), HermanE.Maes (Author)

• New

  Hardcover
  2005

  $238.56

  The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter.The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.