The No1 Ethical retailer for Books, CD’s, DVD’s & Games
30 Day Refund Guarantee

Advanced VLSI Design and Testability Issues

Advanced VLSI Design and Testability Issues

by Sobhit Saxena (Editor), Suman Lata Tripathi (Editor), Sushanta Kumar Mohapatra (Editor)

$53.16

Quantity

10 in stock

More Information

Format: Paperback
 Pages: 378
 Edition: 1
 Publisher: CRC Press
Published: 15 Apr 2022
ISBN 10: 0367538369
ISBN 13: 9780367538361