Characterization, Testing, Measurement, and Metrology (Manufacturing Design and Technology)

by J. Paulo Davim (Editor), Chander Prakash (Editor), Sunpreet Singh (Editor)

New
Hardcover
2020
$187.43

$187.43

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5 in stock

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Format: Hardcover
Pages: 208
Edition: 1
Publisher: CRC Press
Published: 16 Oct 2020
ISBN 10: 0367275155
ISBN 13: 9780367275150

Characterization, Testing, Measurement, and Metrology (Manufacturing Design and Technology)

New

$187.43

$187.43

More Information