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Characterization, Testing, Measurement, and Metrology (Manufacturing Design and Technology)

Characterization, Testing, Measurement, and Metrology (Manufacturing Design and Technology)

by J. Paulo Davim (Editor), Chander Prakash (Editor), Sunpreet Singh (Editor)

$182.18

Quantity

5 in stock

More Information

Format: Hardcover
 Pages: 208
 Edition: 1
 Publisher: CRC Press
Published: 16 Oct 2020
ISBN 10: 0367275155
ISBN 13: 9780367275150