by Brian E. Conway (Editor), Ralph E. White (Editor), John O'M. Bockris (Editor)
This important review series began in 1954 at Academic Press. The latest volume deals with scanning tunneling microscopy, the nickel oxide electrode, radioactive labeling as an in situ method of characterization of solid/liquid interfaces, metallic glasses, reaction kinetics and mechanisms, and DC r
Format: Hardcover
Pages: 340
Edition: 1990
Publisher: Springer
Published: 28 Feb 1990
ISBN 10: 0306433133
ISBN 13: 9780306433139