by Joseph Goldstein (Editor), David C. Joy (Editor), Alton D. Romig Jr. (Editor)
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
Format: Hardcover
Pages: 468
Edition: 1986
Publisher: Springer
Published: 31 Jul 1986
ISBN 10: 0306423871
ISBN 13: 9780306423871