Principles of Analytical Electron Microscopy

Principles of Analytical Electron Microscopy

by Joseph Goldstein (Editor), David C. Joy (Editor), Alton D. Romig Jr. (Editor)

Synopsis

All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.

$187.48

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 468
Edition: 1986
Publisher: Springer
Published: 31 Jul 1986

ISBN 10: 0306423871
ISBN 13: 9780306423871