Reliability and Failure of Electronic Materials and Devices

by Milton Ohring (Author)

• New

  Hardcover
  1998

  $116.42

  Suitable as a reference work for reliability professionals or as a text for graduate students, this book introduces reliability literature of microelectronic and electronic-optional devices. It integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation.