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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) by Manoj Sachdev,José Pineda de Gyvez

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev,José Pineda de Gyvez


ISBN 13: 9780387465463

Format: Hardcover (349 pages)
Publisher: Springer
Published: 04 Jun 2007

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New : $286.58  
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Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Analog Circuits and Signal Processing) Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Analog Circuits and Signal Processing) by Amir Zjajo,José Pineda de Gyvez

Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Analog Circuits and Signal Processing)

by Amir Zjajo,José Pineda de Gyvez


ISBN 13: 9789048197248

Format: Hardcover (250 pages)
Publisher: Springer
Published: 05 Nov 2010

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New : $127.47  
New : $127.47