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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging) Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging) by Pradeep Lall, Michael G. Pecht, Edward B. Hakim

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

by Pradeep Lall, Michael G. Pecht, Edward B. Hakim


ISBN 13: 9780849394508

Format: Hardcover (336 pages)
Publisher: CRC Press
Published: 24 Apr 1997

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