CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
by Andrei Pavlov,Manoj Sachdev
ISBN 13: 9781402083624
Format: Hardcover (212 pages) Publisher: Springer Published: 21 Jun 2008
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
by Manoj Sachdev,José Pineda de Gyvez
ISBN 13: 9780387465463
Format: Hardcover (349 pages) Publisher: Springer Published: 04 Jun 2007
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
by Oleg Semenov,Hossein Sarbishaei,Manoj Sachdev
ISBN 13: 9781402083006
Format: Hardcover (248 pages) Publisher: Springer Published: 06 May 2008
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing)
ISBN 13: 9789048178551
Format: Paperback (212 pages) Publisher: Springer Published: 28 Oct 2010
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
by Arman Vassighi,Manoj Sachdev
ISBN 13: 9780387257624
Format: Illustrated (192 pages) Publisher: Springer Published: 06 Feb 2006
ISBN 13: 9789048178360
Format: Paperback (248 pages) Publisher: Springer Published: 19 Oct 2010
ISBN 13: 9781441938329
Format: Paperback (192 pages) Publisher: Springer Published: 29 Nov 2010