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Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings (Lecture Notes in Computer Science)

by David Naccache,Luca Breveglieri,Israel Koren,Jean-Pierre Seifert

ISBN 13: 9783540462507

Format: Paperback (268 pages)
Publisher: Springer
Published: 13 Jun 2008

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