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Nanometer–scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)

by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

ISBN 13: 9781848219366

Format: Hardcover (316 pages)
Publisher: Wiley-ISTE
Published: 12 Aug 2016

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Les systèmes mécatroniques embarqués: Tome 2, Analyse des causes de défaillances, modélisation, stimulation et optimisation

by Abdelkhalak El Hami,Philippe Pougnet

ISBN 13: 9781784056476

Format: Paperback
Publisher: ISTE éditions
Published: 01 Feb 2020

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