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Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami


ISBN 13: 9781786306401

Format: Hardcover
Publisher: Wiley-ISTE
Published: 17 May 2021

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