Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science)
by Eddy Simoen, Cor Claeys
ISBN 13: 9783319939247
Format: Hardcover (474 pages) Publisher: Springer Published: 22 Aug 2018
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Random Telegraph Signals in Semiconductor Devices (IOP Expanding Physics)
ISBN 13: 9780750312738
Format: Hardcover (218 pages) Publisher: IOP Publishing Published: 24 Dec 2016
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