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Power-Aware Testing and Test Strategies for Low Power Devices

by Patrick Girard, Nicola Nicolici, Xiaoqing Wen

ISBN 13: 9781441909275

Format: Hardcover (353 pages)
Publisher: Springer
Published: 23 Nov 2009

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel

ISBN 13: 9781441909374

Format: Hardcover (171 pages)
Publisher: Springer
Published: 11 Nov 2009

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Dynamic Formal Epistemology (Synthese Library)

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ISBN 13: 9789400700734

Format: Hardcover (252 pages)
Publisher: Springer
Published: 11 Jan 2011

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