Integrated Circuit Defect-Sensitivity: Theory and Computational Models: 208 (The Springer International Series in Engineering and Computer Science)

Integrated Circuit Defect-Sensitivity: Theory and Computational Models: 208 (The Springer International Series in Engineering and Computer Science)

by JosePinedadeGyvez (Author)

Synopsis

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

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Format: Hardcover
Pages: 196
Edition: 1993
Publisher: Springer
Published: 31 Dec 1992

ISBN 10: 0792393066
ISBN 13: 9780792393061