by Abraham Ulman (Series Editor), Abraham Ulman (Series Editor), Janet Perlman (Contributor), Ronald Powell (Series Editor), Maurice H. Francombe (Series Editor)
This volume brings together the previous volumes of this series, which focuses on studies of the properties of various thin films materials and systems.
Format: Hardcover
Pages: 526
Publisher: Academic Press
Published: 12 Aug 1998
ISBN 10: 0125330251
ISBN 13: 9780125330251