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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems) Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems) by Sandeep K. Goel, Krishnendu Chakrabarty

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

by Sandeep K. Goel, Krishnendu Chakrabarty


ISBN 13: 9781439829417

Format: Hardcover (259 pages)
Publisher: CRC Press
Published: 13 Nov 2013

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