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Integrated Circuit Defect-Sensitivity: Theory and Computational Models: 208 (The Springer International Series in Engineering and Computer Science)

by Jose Pineda de Gyvez

ISBN 13: 9780792393061

Format: Hardcover (196 pages)
Publisher: Springer
Published: 31 Dec 1992

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing)

by Manoj Sachdev, Jose Pineda de Gyvez

ISBN 13: 9781441942852

Format: Paperback (352 pages)
Publisher: Springer
Published: 12 Feb 2010

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Integrated Circuit Defect-Sensitivity: Theory And Computational Models (The Springer International Series In Engineering And Computer Science): 208

by Jose Pineda De Gyvez

ISBN 13: 9781461363835

Format: Paperback (196 pages)
Publisher: Springer
Published: 12 Sep 2014

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